The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...

Shared bus interfaces and memory test These days, designs contain a huge number of memory arrays embedded in the core, and these memories often consume a substantial portion of the total chip area.

The use of memory-heavy IP in SoCs for automotive, artificial intelligence (AI), and processor applications is steadily increasing. However, these memory-heavy IP often have only a single access point ...