The cost of testing complex system-on-chip designs will soon surpass the cost of manufacturing them. Clearly this is an unstable situation. It is simply too hard to keep up with Moore's Law. While the ...

Weakness in the semiconductor industry pushed sales of IC wafer testing probe cards down to half of the five-year historic average, or 13.9%, in 2007 according to Santa Clara, Calif.-based market ...

Return to original Test Digest book review. VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Chen-Wen Wu, and Xiaoquing Wen (editors), Elsevier Science ...

In the dynamic world of VLSI (Very Large-Scale Integration), the demand for innovative products is higher than ever. The journey from a concept to a fully functional product involves many challenges ...

Testing microprocessors is becoming more difficult and more time consuming as these devices are designed to take on more complex tasks, such as accelerating artificial intelligence computing, enabling ...

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...

This link below contains information about the Cadence design tools used extensively in classes in the Electrical and Computer Engineering Department at UMass Lowell. Students obtain practical ...