Genmark Automation said it has added a built-in wafer-mapping sensor to its wafer handlers to increase system throughput and provide flawless wafer transfer. The Global Positioning Robot Swap-Master ...

SUNNYVALE, Calif. — In what could boost the cycle times in chip production, Genmark Automation Inc. here has added a built-in wafer-mapping sensor to its line of wafer handling equipment. “The built ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...

KLA Instruments™, a division of KLA Corporation, has expanded its defect inspection and metrology portfolio in 2023 to include new systems for semiconductor process development and control, including ...

Aurora Solar Technologies' founder and COO Gordon Deans tells PV Tech how inline measurement and monitoring can protect yield, prevent process excursions and ultimately, ensure maximum profitability ...

Modern photolithography machines must deliver extraordinary precision on a repeatable basis, and in high volume production. In response to demands for increased throughput in the semiconductor ...