Protection against ESD events (commonly referred to as ESD robustness) is an extremely important aspect of integrated circuit (IC) design and verification, including 2.5/3D designs. ESD events cause ...
2.5D/3D integrated circuits (ICs) have evolved into an innovative solution for many IC design and integration challenges. As shown in figure 1, 2.5D ICs have multiple dies placed side-by-side on a ...
Ethernet is one of the most commonly used communication protocols, and as a result, it has increased the exposure of devices to overvoltage events. The two most common causes of overvoltage events are ...
The global demand for green energy sources is driving strong market growth for solar power systems. Although a great deal of development work is still focused on making PV (photovoltaic) energy ...
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